Course syllabus adopted 2021-02-26 by Head of Programme (or corresponding).
Overview
- Swedish nameAvancerad avbildning och mikroanalys
- CodeTIF340
- Credits7.5 Credits
- OwnerMPPHS
- Education cycleSecond-cycle
- Main field of studyEngineering Physics
- DepartmentPHYSICS
- GradingTH - Pass with distinction (5), Pass with credit (4), Pass (3), Fail
Course round 1
- Teaching language English
- Application code 85116
- Block schedule
- Open for exchange studentsYes
Credit distribution
Module | Sp1 | Sp2 | Sp3 | Sp4 | Summer | Not Sp | Examination dates |
|---|---|---|---|---|---|---|---|
| 0120 Examination 7.5 c Grading: TH | 7.5 c |
|
In programmes
- MPPHS - PHYSICS, MSC PROGR, Year 1 (compulsory elective)
- MPPHS - PHYSICS, MSC PROGR, Year 2 (elective)
Examiner
Lena Falk- Assistant Head of Department, Physics
Eligibility
General entry requirements for Master's level (second cycle)Applicants enrolled in a programme at Chalmers where the course is included in the study programme are exempted from fulfilling the requirements above.
Specific entry requirements
English 6 (or by other approved means with the equivalent proficiency level)Applicants enrolled in a programme at Chalmers where the course is included in the study programme are exempted from fulfilling the requirements above.
Course specific prerequisites
Fundamentals of solid state physicsAim
The purpose of this course is to provide a basic knowledge of the physics behind modern imaging and microanalytical techniques based on the interaction of a probe of energetic electrons or ions with matter, and to develop an understanding of how different signals generated in these processes may be interpreted in terms of a materials structure at the atomic, nano and micro scales. The course will also give some practical experience of up-to-date instrumentation utilizing the techniques in imaging and microanalysis that are discussed. The techniques discussed in the course are powerful tools that are widely used in materials research and development in both industry and academia. The course provides a basis for specialised courses in, for example, experimental physics, materials physics and nanoscience.Learning outcomes (after completion of the course the student should be able to)
After completion of this course the student should be able to discuss the physics behind image formation, diffraction and microanalysis based on electron interaction with mattter. The student should also be able to discuss critical aspects of modern electron and ion imaging and microanalytical techniques in terms of obtained information, resolution, accuracy and sensitivity. The student will get both theoretical and practical experience of the scanning and transmission electron microscopes (SEM, TEM), focused ion beam instruments (FIB) and microanalytical techniques such as X-ray energy dispersive spectrometry (XEDS) and electron energy loss spectroscopy (EELS).Content
Electron interaction with matter. Ion interaction with matter.
Image formation using lenses.
Electron diffraction.
X-ray energy dispersive spectrometry (XEDS)
Electron energy loss spectroscopy (EELS).
Resolution.
Scanning electron microscopy (SEM).
Transmission electron microscopy (TEM).
Focused ion beam (FIB) instruments.
Organisation
The course comprises lectures, tutorials and compulsory laboratory sessions.Literature
Selected chapters in the following two ebooks:
1. Transmission Electron Microscopy [electronic resource] : A Textbook for Materials Science
by David B. Williams, C. Barry Carter. Springer eBooks, New York, NY : Springer US : Imprint: Springer, 2009, 2nd ed. 2009.
2. Scanning Electron Microscopy and X-Ray Microanalysis [electronic resource]
Examination including compulsory elements
Written examination. Compulsory laboratory sessions.The course examiner may assess individual students in other ways than what is stated above if there are special reasons for doing so, for example if a student has a decision from Chalmers on educational support due to disability.